Re-print of “Sub-eV Ion Deposition Utilizing Soft-Landing Ion Mobility for Controlled Ion, Ion Cluster, and Charged Nanoparticle Deposition”

[Display omitted] •Controlled ion deposition using soft-landing ion mobility for a variety of applications.•Soft-landing hafnium oxide onto graphene has enabled the production of p-type material.•The use of soft-landed silver nanoparticles for MALDI and SERS analysis. Sub-eV ion deposition via soft-...

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Bibliographic Details
Published inInternational journal of mass spectrometry Vol. 377; pp. 214 - 221
Main Authors Walton, Barbara L., Hoffmann, William D., Verbeck, Guido F.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.02.2015
Subjects
Ion mobility
MALDI
Preparative mass spectrometry
Soft-landing
Sub-eV deposition
Surface enhanced Raman
Preparative mass spectrometry
Soft-landing
Ion mobility
Sub-eV deposition
Surface enhanced Raman
MALDI
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Summary:[Display omitted] •Controlled ion deposition using soft-landing ion mobility for a variety of applications.•Soft-landing hafnium oxide onto graphene has enabled the production of p-type material.•The use of soft-landed silver nanoparticles for MALDI and SERS analysis. Sub-eV ion deposition via soft-landing ion mobility has been utilized for a variety of applications. It has allowed for the deposition of a dielectric material onto graphene without introducing defects into the lattice structure. This deposition technique has also been used for surface enhanced Raman studies. Deposited silver has also been used as an alternative MALDI matrix for low mass compounds and shows promise for imaging applications.
ISSN:1387-3806
1873-2798
DOI:10.1016/j.ijms.2014.08.016