Formation and properties of mixed copper sulfide (CuxS) layers on polypropylene

The sorption-diffusion method was used to obtain nonstoichiometric copper sulfide layers on polypropylene. Copper sulfide layers consisted of monoclinic structures chalcocite Cu2S and djurleite Cu1.8S. This multiphase composition of obtained thin layers was confirmed by X-ray diffraction spectroscop...

Full description

Saved in:
Bibliographic Details
Published inSurfaces and interfaces Vol. 21; p. 100801
Main Authors Balciunaite, Egle, Petrasauskiene, Neringa, Alaburdaite, Rasa, Jakubauskas, Gediminas, Paluckiene, Edita
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.12.2020
Subjects
AFM
Copper sulfide
Optical properties
Polypropylene
Surfaces modification
Thin film
AFM
Polypropylene
Optical properties
Copper sulfide
Thin film
Surfaces modification
Online AccessGet full text

Cover

More Information
Summary:The sorption-diffusion method was used to obtain nonstoichiometric copper sulfide layers on polypropylene. Copper sulfide layers consisted of monoclinic structures chalcocite Cu2S and djurleite Cu1.8S. This multiphase composition of obtained thin layers was confirmed by X-ray diffraction spectroscopy. The surface morphology of layers was studied by SEM micrographs and the surface roughness was calculated from AFM data. The value for the direct bandgap for the CuxS thin layers approximately equals 2.53 eV. The changes in mechanical properties (tensile strength analysis) of polypropylene films through the CuxS layer deposition process were investigated.
ISSN:2468-0230
2468-0230
DOI:10.1016/j.surfin.2020.100801