Physicochemical Interaction and Atomic Structure at Cu-MgO Interfaces

Physicochemical interactions at Cu-MgO buried interfaces are studied by electron X-ray emission spectroscopy and compared to results obtained for native interfaces. The atomic arrangement is also determined. The role of the characteristics of the substrate is evidenced. Results suggest that weak or...

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Bibliographic Details
Published inMicroscopy microanalysis microstructures (Les Ulis) Vol. 8; no. 4-5; pp. 325 - 334
Main Authors Jonnard, Philippe, Hombourger, Chrystel, Vergand, Françoise, Bonnelle, Christiane, Renou, Alain, Assaban, Albert, Gillet, Eveline, Gillet, Marcel
Format Journal Article
LanguageEnglish
Published EDP Sciences 01.08.1997
Subjects
6848
6855
7870E
atomic arrangement
atomic structure
buried interfaces
buried layers
copper
Cu MgO
Cu MgO interfaces
electron X ray emission spectroscopy
interface structure
magnesium compounds
metallic thin films
MgO
native interfaces
physicochemical interaction
strong interactions
substrate characteristics
substrates
weak interactions
X ray emission spectra
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Summary:Physicochemical interactions at Cu-MgO buried interfaces are studied by electron X-ray emission spectroscopy and compared to results obtained for native interfaces. The atomic arrangement is also determined. The role of the characteristics of the substrate is evidenced. Results suggest that weak or strong interactions can be present at the interfaces.
Bibliography:ark:/67375/80W-P740L62P-F
publisher-ID:mmm_1997__8_4-5_325_0
istex:5FB39A168BF9F83DF917D1C788C3344094AE9948
ISSN:1154-2799
DOI:10.1051/mmm:1997125