Optimization of deconvoluted parameter for the quantification of high-resolution SIMS depth profiles
It is demonstrated in this paper that the searching step τ in the TV-Tikhonov algorithm plays an important role for determining the original layer structure directly from measured high-resolution depth profiling data. The optimization of τ is very necessary for obtaining a reliable deconvoluted resu...
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Published in | Vacuum Vol. 215; p. 112342 |
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Main Authors | , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier Ltd
01.09.2023
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Subjects | |
Online Access | Get full text |
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Summary: | It is demonstrated in this paper that the searching step τ in the TV-Tikhonov algorithm plays an important role for determining the original layer structure directly from measured high-resolution depth profiling data. The optimization of τ is very necessary for obtaining a reliable deconvoluted result. Considering a large increase of simulated data points by decreasing the depth interval for quantification of high-resolution depth profiling data, the optimization of τ is performed simply by one-dimensional search algorithm. Furthermore, the noise effects from “measured” depth profiling data on the deconvoluted profile with different optimal τ values are also quantitatively evaluated. Finally, as examples, the measured SIMS depth profiling data of the two In nano-layers embedded in InGaAs thin films and the 28Si/30Si isotope nano-superlattices are deconvoluted directly and the respective original layer structures are obtained accordingly.
•A method for deconvolution of measured high-resolution depth profiling data is proposed.•The optimization of searching step τ in the method is very necessary and is performed by one-dimensional search algorithm.•The noise effects on the deconvoluted profile with different optimal τvalues are quantitatively evaluated.•The original layer structures of In nano-layers and Si isotope nano-superlattices are obtained by the developed method. |
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ISSN: | 0042-207X 1879-2715 |
DOI: | 10.1016/j.vacuum.2023.112342 |