Optimization of deconvoluted parameter for the quantification of high-resolution SIMS depth profiles

It is demonstrated in this paper that the searching step τ in the TV-Tikhonov algorithm plays an important role for determining the original layer structure directly from measured high-resolution depth profiling data. The optimization of τ is very necessary for obtaining a reliable deconvoluted resu...

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Bibliographic Details
Published inVacuum Vol. 215; p. 112342
Main Authors Li, T.T., Zhuang, X.M., Li, H.M., Xu, Y.X., Ma, Z.Q., Zheng, J.Q., Geng, Y.Q., Wang, C.L., Lian, S.Y., Wang, J.Y., Xu, C.K.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.09.2023
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Summary:It is demonstrated in this paper that the searching step τ in the TV-Tikhonov algorithm plays an important role for determining the original layer structure directly from measured high-resolution depth profiling data. The optimization of τ is very necessary for obtaining a reliable deconvoluted result. Considering a large increase of simulated data points by decreasing the depth interval for quantification of high-resolution depth profiling data, the optimization of τ is performed simply by one-dimensional search algorithm. Furthermore, the noise effects from “measured” depth profiling data on the deconvoluted profile with different optimal τ values are also quantitatively evaluated. Finally, as examples, the measured SIMS depth profiling data of the two In nano-layers embedded in InGaAs thin films and the 28Si/30Si isotope nano-superlattices are deconvoluted directly and the respective original layer structures are obtained accordingly. •A method for deconvolution of measured high-resolution depth profiling data is proposed.•The optimization of searching step τ in the method is very necessary and is performed by one-dimensional search algorithm.•The noise effects on the deconvoluted profile with different optimal τvalues are quantitatively evaluated.•The original layer structures of In nano-layers and Si isotope nano-superlattices are obtained by the developed method.
ISSN:0042-207X
1879-2715
DOI:10.1016/j.vacuum.2023.112342