A New Method for Measurements of the Poloidal Rotation Velocities and Wavelength Calibration of X-ray Imaging Crystal Spectrometer in Magnetic Fusion Devices

A new simple method is presented for the wavelength calibration and measurement of poloidal rotation velocities with X-ray imaging crystal spectrometer（XICS）in magnetic fusion devices.In this method,the toroidal rotation of plasma is applied for high precise alignment and wavelength calibration of t...

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Bibliographic Details
Published inPlasma science & technology Vol. 17; no. 4; pp. 265 - 267
Main Author 石跃江 吕波 王福地 M.BITTER K.W.HILL 叶民友
Format Journal Article
LanguageEnglish
Published 01.04.2015
Subjects
Calibration
Crystals
Devices
Imaging
Spectrometers
Thresholds
Wavelengths
X-rays
X射线成像
成像光谱仪
晶体谱仪
水晶
波长校准
测量
磁聚变装置
转动速度
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Summary:A new simple method is presented for the wavelength calibration and measurement of poloidal rotation velocities with X-ray imaging crystal spectrometer（XICS）in magnetic fusion devices.In this method,the toroidal rotation of plasma is applied for high precise alignment and wavelength calibration of the poloidal XICS.The measurement threshold of poloidal rotation velocity can be lowered to 1-3 km/s with this method.
Bibliography:34-1187/TL
X-ray imaging crystal spectrometer wavelength calibration poloidal rotation velocity
A new simple method is presented for the wavelength calibration and measurement of poloidal rotation velocities with X-ray imaging crystal spectrometer（XICS）in magnetic fusion devices.In this method,the toroidal rotation of plasma is applied for high precise alignment and wavelength calibration of the poloidal XICS.The measurement threshold of poloidal rotation velocity can be lowered to 1-3 km/s with this method.
ObjectType-Article-1
SourceType-Scholarly Journals-1
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content type line 23
ISSN:1009-0630
DOI:10.1088/1009-0630/17/4/01