UHV-AFM study of MBE-grown 10 nm scale ridge quantum wires
We evaluate the shape of ridge quantum wires (RQWIs) with nm-scale resolution by using SEM and ultra-high-vacuum (UHV) AFM system which is connected to MBE chamber. This MBE-AFM system provides us a detailed information about the evolution of size and uniformity of ridges grown under various conditi...
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Published in | Journal of crystal growth Vol. 175; pp. 804 - 808 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.05.1997
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Subjects | |
Online Access | Get full text |
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Summary: | We evaluate the shape of ridge quantum wires (RQWIs) with nm-scale resolution by using SEM and ultra-high-vacuum (UHV) AFM system which is connected to MBE chamber. This MBE-AFM system provides us a detailed information about the evolution of size and uniformity of ridges grown under various conditions. In this report, we investigate systematically how the growth temperature
T
s and As flux affect the width and morphology of GaAs ridge structure. The results show that a very sharp and uniform GaAs ridge structures (
W < 10 nm) can be obtained. On the basis of this understanding, we fabricated the ridge quantum wire of 10 nm width. |
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ISSN: | 0022-0248 1873-5002 |
DOI: | 10.1016/S0022-0248(96)01204-3 |