Time redundancy based soft-error tolerance to rescue nanometer technologies

The increased operating frequencies, geometry shrinking and power supply reduction that accompany the process of very deep submicron scaling, affect the reliable operation of very deep submicron ICs. The effects of various noise sources are becoming of great concern. In particularly, it is predicted...

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Bibliographic Details
Published inProceedings 17th IEEE VLSI Test Symposium (Cat. No.PR00146) pp. 86 - 94
Main Author Nicolaidis, M.
Format Conference Proceeding
LanguageEnglish
Published IEEE 1999
Subjects
Alpha particles
Error analysis
Fault tolerance
Frequency
Geometry
Power supplies
Redundancy
Sea level
Single event upset
Space technology
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Summary:The increased operating frequencies, geometry shrinking and power supply reduction that accompany the process of very deep submicron scaling, affect the reliable operation of very deep submicron ICs. The effects of various noise sources are becoming of great concern. In particularly, it is predicted that single event upsets induced by alpha particles and cosmic radiation will become a cause of unacceptable error rates in future very deep submicron and nanometer technologies. This problem, concerning in the past more often parts used in space, will affect future ICs at sea level. This challenging problem has to be solved otherwise technological progress will be blocked soon. Thus, fault tolerant design is becoming necessary, even for commodity applications. But economic constraints of commodity applications exclude the use of traditional, high-cost fault tolerant techniques. This work uses time redundancy techniques to derive low cost soft-error tolerant implementations for logic networks.
ISBN:076950146X
9780769501468
ISSN:1093-0167
2375-1053
DOI:10.1109/VTEST.1999.766651