An investigation of doped polypyrrole by a combination of scanning tunnelling and atomic force microscopes

In this paper the results obtained by a combination of the scanning tunnelling microscope (STM) and of the atomic force microscope (AFM) on a polypyrrole sample doped by a sulfonated poly(β-hydroxyether) matrix are presented. On the sample surface the existence of domains with very different conduct...

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Bibliographic Details
Published inSynthetic metals Vol. 67; no. 1; pp. 211 - 214
Main Authors Dietler, G., Heuberger, M., Tresch, S., Bujard, P.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.11.1994
Subjects
Doping
Microscopes
Polypyrrole
Microscopes
Polypyrrole
Doping
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Summary:In this paper the results obtained by a combination of the scanning tunnelling microscope (STM) and of the atomic force microscope (AFM) on a polypyrrole sample doped by a sulfonated poly(β-hydroxyether) matrix are presented. On the sample surface the existence of domains with very different conductivity is observed. These domains also exhibit a pressure-dependent conductivity which can be evidenced by curves of current versus distance and force versus distance recorded with the AFM/STM combination.
ISSN:0379-6779
1879-3290
DOI:10.1016/0379-6779(94)90043-4