Measurement of strong interaction effects in Σ atoms

X-rays produced by Σ-atoms in targets of O, Mg, Al, Si and S have been observed. The shifts, widths and yields of the last observed X-ray due to the strong interaction have been measured. A fit to the data using the optical model gives a value for the effective scattering length which appears to dif...

Full description

Saved in:
Bibliographic Details
Published inPhysics letters. B Vol. 74; no. 1-2; pp. 27 - 30
Main Authors Batty, C.J., Biagi, S.F., Blecher, M., Hoath, S.D., Riddle, R.A.J., Roberts, B.L., Davies, J.D., Pyle, G.J., Squier, G.T.A., Asbury, D.M.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 27.03.1978
Online AccessGet full text

Cover

More Information
Summary:X-rays produced by Σ-atoms in targets of O, Mg, Al, Si and S have been observed. The shifts, widths and yields of the last observed X-ray due to the strong interaction have been measured. A fit to the data using the optical model gives a value for the effective scattering length which appears to differ significantly from the free value.
ISSN:0370-2693
1873-2445
DOI:10.1016/0370-2693(78)90050-3