A method of avoiding wavelength-dependent errors in decay-time measurements
The influence of wavelength-dependent photoelectron transit time on decay-time measurements for different photomultipliers is discussed. A new correction method is proposed. From the experimental results two conclusions are drawn: (a) a discrepancy exists between the calculated and measured correcti...
Saved in:
| Published in | Optics communications Vol. 28; no. 1; pp. 91 - 96 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
Elsevier B.V
1979
|
| Online Access | Get full text |
Cover
Loading…
| Summary: | The influence of wavelength-dependent photoelectron transit time on decay-time measurements for different photomultipliers is discussed. A new correction method is proposed. From the experimental results two conclusions are drawn: (a) a discrepancy exists between the calculated and measured correction factors and (b) not only wavelength-dependent errors but also errors caused by different spatial distributions of fluorescence and scattered light must be taken into account. |
|---|---|
| ISSN: | 0030-4018 1873-0310 |
| DOI: | 10.1016/0030-4018(79)90176-7 |