Error analysis on the phase calculation from superimposed interferograms generated by a wavelength scanning interferometer

An error analysis of wavelength scanning interferometry is shown, in which the interferogram obtained is constructed from more than one interferogram. Computer simulations are carried out to confirm the theoretical considerations in calculating the phase distribution of the individual interferograms...

Full description

Saved in:
Bibliographic Details
Published inOptics communications Vol. 77; no. 5; pp. 343 - 348
Main Authors Okada, Katsuyuki, Sakuta, Hironobu, Ose, Teruji, Tsujiuchi, Jumpei
Format Journal Article
LanguageEnglish
Published Elsevier B.V 15.07.1990
Online AccessGet full text

Cover

More Information
Summary:An error analysis of wavelength scanning interferometry is shown, in which the interferogram obtained is constructed from more than one interferogram. Computer simulations are carried out to confirm the theoretical considerations in calculating the phase distribution of the individual interferograms.
ISSN:0030-4018
1873-0310
DOI:10.1016/0030-4018(90)90122-A