Crystal spectrometer for measurements of pionic X-rays

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 238; no. 2; pp. 365 - 380
• Main Authors: Beer, W., Bos, K., De Chambrier, G., Giovanetti, K.L., Goudsmit, P.F.A., Grigoryev, B.V., Jeckelmann, B., Knecht, L., Kondurova, L.N., Langhans, J., Leisi, H.J., Levchenko, P.M., Marushenko, V.I., Mezentsev, A.F., Obermeier, H., Petrunin, A.A., Rohrer, U., Sergeev, A.G., Skornjakov, S.G., Smirnov, A.I., Steiner, E., Strassner, G., Suvorov, V.M., Vacchi, A.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.08.1985
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/0168-9002(85)90474-7

A description is given of a bent-crystal spectrometer for pionic X-rays. The instrument is of the modified DuMond type and makes use of a combined π-production-X-ray target. It is situated in a 20 μA, 590 MeV proton beam at SIN. Combination of high mechanical precision and a laser interferometer system makes it possible to measure wavelength ratios with a precision of 1–2 parts per million.