Coincidence counting analysis of secondary ions emitted from a phenylalanine target under multicharged MeV carbon bombardment

Coincidence counting techniques for time-of-flight mass spectrometry have been applied to the study of secondary ion correlations. Phenylalanine samples were exposed to 2.5 MeV carbon ions with charge states ranging from +1 to +6. The influences of the projectile charge state on secondary ion yields...

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Bibliographic Details
Published inInternational journal of mass spectrometry and ion processes Vol. 136; no. 2; pp. 107 - 117
Main Authors Ray, K.B., da Silveira, E.F., Jeronymo, J.M.F., Baptista, G.B., Leite, C.V.Barros, Schweikert, E.A.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 22.09.1994
Subjects
Coincidence counting
Correlated ion emission
Ion desorption
Coincidence counting
Correlated ion emission
Ion desorption
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Summary:Coincidence counting techniques for time-of-flight mass spectrometry have been applied to the study of secondary ion correlations. Phenylalanine samples were exposed to 2.5 MeV carbon ions with charge states ranging from +1 to +6. The influences of the projectile charge state on secondary ion yields and correlations are reported. The degree of secondary ion correlation was observed to decrease as the charge state of the primary ion increases. For the cases studied, the data indicate that more inefficient projectiles are better suited for monitoring secondary ion correlations.
ISSN:0168-1176
1873-2801
DOI:10.1016/0168-1176(94)04045-1