Double particle resolution measured in a silicon drift chamber

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 316; no. 2; pp. 283 - 288
• Main Authors: Clemen, Mark, Humanic, T., Kraus, D., Vilkelis, G., Rehak, P., Holl, P., Gatti, E., Sampietro, M., Kemmer, J.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.06.1992
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/0168-9002(92)90911-M

The two-hit resolution of a silicon drift chamber is measured using a pulsed Nd: YAG laser and a time digitizer readout. The data is analyzed by forming the covariance matrix in time samples, and transforming to a matrix in amplitude and time variation of each of the two hits. The resolution on the two-hit separation is found to be better than 25 μm with a drift field of 530 V/cm and a separation of more than 500 μm, with the resolution increasing to 50 μm as the separation nears 500 μ. Results are also presented for multiply ionizing tracks, showing a great improvement over single minimum ionizing.