Effects of device structure on thermo-optic switch and design optimization

The study on reliability of multi-layer structure of thermo-optic switch under thermal mechanical coupling effect is the basic research subject in modern micro-optoelectronics. Power consumption and response time are the most important performance indexes. Based on the generalized thermoelasticity t...

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Bibliographic Details
Published inOptik (Stuttgart) Vol. 201; p. 163390
Main Authors Long, Zhang, Xiaomin, Zhang, Jiyun, Song, Hengwei, Zheng
Format Journal Article
LanguageEnglish
Published Elsevier GmbH 01.01.2020
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Summary:The study on reliability of multi-layer structure of thermo-optic switch under thermal mechanical coupling effect is the basic research subject in modern micro-optoelectronics. Power consumption and response time are the most important performance indexes. Based on the generalized thermoelasticity theory, thermo-optic switch models of various structures are built to simulate the temperature and stress field for structure optimization. The numerical results show that an appropriate cross-section shape can reduce the switch power consumption without prejudice to the response speed, the refractive index of the core layer varies with the temperature, and the inter-layer thermal mismatching stress of the double-ridge structure is the maximum. The above findings will introduce new ideas for research and development and design of new optic switches.
ISSN:0030-4026
1618-1336
DOI:10.1016/j.ijleo.2019.163390