Structural, morphological, optical, and electrical properties of In2O3 nanostructured thin films

• Published in: Optik (Stuttgart) Vol. 127; no. 18; pp. 7319 - 7325
• Main Authors: Bouhdjer, A., Saidi, H., Attaf, A., Aida, M.S., JlassI, Mohamed, Bouhaf, I., Benkhetta, Y., Bendjedidi, H.
• Format: Journal Article
• Language: English
• Published: Elsevier GmbH 01.09.2016
• Subjects: Flow rate; Indium oxide; Optical and electrical properties; Ultrasonic spray; Ultrasonic spray; Optical and electrical properties; Flow rate; Indium oxide
• ISSN: 0030-4026; 1618-1336
• DOI: 10.1016/j.ijleo.2016.05.035

Indium oxide (In2O3) nanostructured thin films are prepared by ultrasonic spray technique on glass substrates at 350°C. Solution flow rate influence on the structural, morphological, optical and electrical properties of these samples is then studied. A number of techniques, as well as X-ray diffraction (XRD), SEM, and UV–vis are used to characterize the physical properties of these films. X-ray diffraction analysis indicates the spherical indium oxide nanoparticles (20nm to 67nm) were in single-crystalline phase with body-centered cubic structure, and the preferred growth orientation change with the change of Solution Spray Rate. The films exhibit high optical transparency >80% in the visible region. The higher value of the optical band gap was 3.93eV due to the quantum confinement effect. The film grown at 55ml/h showed low resistivity (8.510−3Ωcm).