Thermally-induced electronic relaxation in structurally-modified Cu0.1Ni0.8Co0.2Mn1.9O4 spinel ceramics

• Published in: Physica. B, Condensed matter Vol. 459; pp. 116 - 121
• Main Authors: Shpotyuk, O., Balitska, V., Brunner, M., Hadzaman, I., Klym, H.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.02.2015
• Subjects: Ceramics; Electrical resistance; Stretched exponential relaxation; Electrical resistance; Stretched exponential relaxation; Ceramics
• ISSN: 0921-4526; 1873-2135
• DOI: 10.1016/j.physb.2014.11.023

Thermally-induced electronic relaxation in structurally-modified Cu0.1Ni0.8Co0.2Mn1.9O4 spinel ceramics is shown to be adequately described by stretched exponential function on time. This kinetics is defined by microsctructure perfectness of the relaxing media, showing obvious onset to stretched exponential behaviour with non-exponentionality index attaining close to 0.43 values for high-monolith ceramics and smaller ones in fine-grained ceramics. Percolation threshold in relaxation-degradation kinetics is detected for ceramics with 10% of NiO extractions, showing the smallest but most prolonged single-path degradation effect. This finding is treated in terms of Phillips’ axiomatic diffusion-to-trap model, where only one of two relaxation channels (caused by operative short-range forces) occurs to be effective, while additional non-operative channels contribute to electronic relaxation in fine-grained ceramics.