Optical properties of rare-earth doped epitaxial Sr0.5Ba0.5Nb2O6 thin films grown by pulsed laser deposition

Optical quality rare-earth (RE) (Nd3+, Eu3+, Gd3+ and Yb3+) doped Sr0.5Ba0.5Nb2O6 (SBN) epitaxial films of ~170nm thick have been successfully grown on MgO (100) single crystal substrates using pulsed laser deposition technique. Strong residual stress in these films has been revealed by Raman spectr...

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Published inThin solid films Vol. 519; no. 1; pp. 52 - 57
Main Authors YAO, Y. B, LIU, W. C, MAY, C. L, WONG, K. H, TAM, H. L, CHEAH, K. W
Format Journal Article
LanguageEnglish
Published Amsterdam Elsevier 29.10.2010
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Summary:Optical quality rare-earth (RE) (Nd3+, Eu3+, Gd3+ and Yb3+) doped Sr0.5Ba0.5Nb2O6 (SBN) epitaxial films of ~170nm thick have been successfully grown on MgO (100) single crystal substrates using pulsed laser deposition technique. Strong residual stress in these films has been revealed by Raman spectroscopic studies. Two kinds of in-plane orientations with respect to the MgO substrate co-exist. All the film samples show high transparency in the visible wavelength. Their band-gap energies appear to be independent of the types of dopant. Photoluminescence (PL) spectra of RE-doped SBN ceramics show a strong and broad emission band at around 600nm (2.07eV). The peak position of this emission band changes slightly with different RE-dopants. Thin film samples, however, yield a broad PL band at around 385nm (3.22eV). This UV emission shows no observable shift in the peak position for different dopants. Apart from these broad emission bands, conspicuous emission lines from Eu3+ and Nd3+ ions are also noted. The origins of these PL spectra are discussed.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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content type line 23
ISSN:0040-6090
1879-2731
DOI:10.1016/j.tsf.2010.07.059