Preparation, structural characterization and electrical studies on NiO doped PVA films

NiO nanoparticles were prepared by chemical precipitation technique. Films of NiO doped PVA nanocomposites are synthesized by solution casting process. NiO doped PVA nanocomposite films were characterized by XRD and FTIR techniques. XRD analysis revealed the nanocrystalline nature of samples. FTIR a...

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Bibliographic Details
Published inMaterials today : proceedings Vol. 5; no. 4; pp. 10839 - 10844
Main Authors Irfan, Mohammed, Razikha Banu, S., Sahana Kumari, R., Veena, B.M., Madhu, B.J., Manjunath, A.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 2018
Subjects
AC conductivity
Dielectric constant
FTIR
Nanocomposite films
XRD
Dielectric constant
XRD
Nanocomposite films
FTIR
AC conductivity
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Summary:NiO nanoparticles were prepared by chemical precipitation technique. Films of NiO doped PVA nanocomposites are synthesized by solution casting process. NiO doped PVA nanocomposite films were characterized by XRD and FTIR techniques. XRD analysis revealed the nanocrystalline nature of samples. FTIR analysis revealed the existence of C-O and Ni-O in films. Dielectric and a.c. conductivity studies were carried out. The dielectric constant (ε′) of the sample is found to decrease with rise in frequency. The a.c. conductivity was found to rise with rise in frequency. The electrical conduction mechanism in present sample is found to be in agreement with an electron-hopping model. Present NiO doped PVA nanocomposites may find applications in the electronic energy storage devices.
ISSN:2214-7853
2214-7853
DOI:10.1016/j.matpr.2017.12.371