Residual Doppler Effect on Electromagnetically Induced Transparency in a Zeeman Sublevel System

We investigate the residual Doppler effect on the linewidth of electromagnetieally induced transparency （EIT） in a Zeeman sublevel system where a careful experimental design ensures the smallest measurement error. The overall measurement error of the EIT linewidth is estimated to be less than 5%. We...

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Bibliographic Details
Published inChinese physics letters Vol. 27; no. 5; pp. 138 - 141
Main Author 胡振燕 李路明 陈佩荣 孙欣
Format Journal Article
LanguageEnglish
Published IOP Publishing 01.05.2010
Subjects
Design engineering
Deviation
Doppler effect
Error analysis
Errors
企业所得税
塞曼效应
多普勒效应
实验设计
电磁感应透明
线宽测量
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Summary:We investigate the residual Doppler effect on the linewidth of electromagnetieally induced transparency （EIT） in a Zeeman sublevel system where a careful experimental design ensures the smallest measurement error. The overall measurement error of the EIT linewidth is estimated to be less than 5%. We present the linear dependence of EIT resonance broadening at small angular deviation in detail. The theoretical analysis exploits the dependence of this feature and shows the qualitative agreement between numerical results and experimental results.
Bibliography:11-1959/O4
O42
O562.32
ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/27/5/054212