Microstructural and optical properties of strain compensated InxGa1-xAs/InyAl1-yAs multiple quantum wells
TEM and photocurrent (PC) measurements were carried out to investigate the microstructural and excitonic transitions in In0.52Ga0.48As /In0.55Al0.45As multiple quantum wells (MQWs). TEM images showed that high-quality 11-period strain-compensated In0.52Ga0.48As /In0.55Al0.45As MQWs had high-quality...
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Published in | The Journal of physics and chemistry of solids Vol. 63; no. 1; pp. 89 - 93 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Oxford
Elsevier
01.01.2002
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Subjects | |
Online Access | Get full text |
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Summary: | TEM and photocurrent (PC) measurements were carried out to investigate the microstructural and excitonic transitions in In0.52Ga0.48As /In0.55Al0.45As multiple quantum wells (MQWs). TEM images showed that high-quality 11-period strain-compensated In0.52Ga0.48As /In0.55Al0.45As MQWs had high-quality heterointerfaces. Based on the TEM results, a possible crystal structure for the In0.52Ga0.48As /In0.55Al0.45As MQWs is presented, and their strains are compensated. The results for the PC data at 300K for several applied electric fields showed that several excitonic transitions shifted to longer wavelengths as the applied electric field increased. These results indicate that the strain-compensated In0.52Ga0.48As/In0.55Al0.45As MQWs hold promise for electroabsorption modulator devices. 16 refs. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0022-3697 1879-2553 |
DOI: | 10.1016/S0022-3697(01)00082-8 |