Microstructural and optical properties of strain compensated InxGa1-xAs/InyAl1-yAs multiple quantum wells

TEM and photocurrent (PC) measurements were carried out to investigate the microstructural and excitonic transitions in In0.52Ga0.48As /In0.55Al0.45As multiple quantum wells (MQWs). TEM images showed that high-quality 11-period strain-compensated In0.52Ga0.48As /In0.55Al0.45As MQWs had high-quality...

Full description

Saved in:
Bibliographic Details
Published inThe Journal of physics and chemistry of solids Vol. 63; no. 1; pp. 89 - 93
Main Authors KIM, T. W, LEE, D. U, CHOO, D. C
Format Journal Article
LanguageEnglish
Published Oxford Elsevier 01.01.2002
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:TEM and photocurrent (PC) measurements were carried out to investigate the microstructural and excitonic transitions in In0.52Ga0.48As /In0.55Al0.45As multiple quantum wells (MQWs). TEM images showed that high-quality 11-period strain-compensated In0.52Ga0.48As /In0.55Al0.45As MQWs had high-quality heterointerfaces. Based on the TEM results, a possible crystal structure for the In0.52Ga0.48As /In0.55Al0.45As MQWs is presented, and their strains are compensated. The results for the PC data at 300K for several applied electric fields showed that several excitonic transitions shifted to longer wavelengths as the applied electric field increased. These results indicate that the strain-compensated In0.52Ga0.48As/In0.55Al0.45As MQWs hold promise for electroabsorption modulator devices. 16 refs.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0022-3697
1879-2553
DOI:10.1016/S0022-3697(01)00082-8