Using Model for Assessment of Complementary Metal Oxide Semiconductor Technology and Roadmaps as a Pre-Simulation Program with Integrated Circuit Emphasis Model Generator for Early Technology and Circuit Simulation

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 47; no. 5R; p. 3384
Main Authors Boeuf, Frederic, Sellier, Manuel, Payet, Fabrice, Borot, Bertrand, Skotnicki, Thomas
Format Journal Article
LanguageEnglish
Published 01.05.2008
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ISSN0021-4922
1347-4065
DOI10.1143/JJAP.47.3384

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ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.47.3384