Improving Spatial and Elemental Associations in Analytical Field Ion Microscopy

• Published in: Microscopy and microanalysis Vol. 29; no. 3; pp. 1077 - 1086
• Main Authors: F. Morgado, Felipe, Stephenson, Leigh, Rousseau, Loic, Vurpillot, François, Evertz, Simon, Schneider, Jochen M, Gault, Baptiste
• Format: Journal Article
• Language: English
• Published: Cambridge University Press 09.06.2023
• Subjects: Condensed Matter; Instrumentation and Detectors; Physics; time-of-flight spectrometry; analytical field ion microscopy; atomic resolution; correlation filtering; atom probe tomography
• ISSN: 1431-9276; 1435-8115
• DOI: 10.1093/micmic/ozad039

Abstract Chemically resolved atomic resolution imaging can give fundamental information about material properties. However, even today, a technique capable of such achievement is still only an ambition. Here, we take further steps in developing the analytical field ion microscopy (aFIM), which combines the atomic spatial resolution of field ion microscopy (FIM) with the time-of-flight spectrometry of atom probe tomography (APT). To improve the performance of aFIM that are limited in part by a high level of background, we implement bespoke flight path time-of-flight corrections normalized by the ion flight distances traversed in electrostatic simulations modeled explicitly for an atom probe chamber. We demonstrate effective filtering in the field evaporation events upon spatially and temporally correlated multiples, increasing the mass spectrum's signal-to-background. In an analysis of pure tungsten, mass peaks pertaining to individual W isotopes can be distinguished and identified, with the signal-to-background improving by three orders of magnitude over the raw data. We also use these algorithms for the analysis of a CoTaB amorphous film to demonstrate application of aFIM beyond pure metals and binary alloys. These approaches facilitate elemental identification of the FIM-imaged surface atoms, making analytical FIM more precise and reliable.