A novel X-ray spectrometer for plasma hot spot diagnosis

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 866; pp. 72 - 75
• Main Authors: Shi, Jun, Guo, Yongchao, Xiao, Shali, Yang, Zuhua, Qian, Feng, Cao, LeiFeng, Gu, Yuqiu
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 11.09.2017
• Subjects: Elliptical crystal; Plasma; X-ray imaging; X-ray spectrum; Plasma; Elliptical crystal; X-ray spectrum; X-ray imaging
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2017.05.030

A novel X-ray spectrometer is designed to diagnose the different conditions in plasmas. It can provide both X-ray spectroscopy and plasma image information simultaneously. Two pairs of elliptical crystal analyzers are used to measure the X-ray spectroscopy in the range of 2–20 keV. The pinhole imaging system coupled with gated micro-channel plate(MCP) detectors are developed, which allows 20 images to be collected in a single individual experiment. The experiments of measuring spectra were conducted at “Shenguang-II upgraded laser” in China Academy of Engineering Physics to demonstrate the utility of the spectrometer. The X-ray spectroscopy information was obtained by the image plate(IP). The hot spot imaging experiments were carried out at “Shenguang-III prototype facility”. We have obtained the hot sport images with the spectrometer, and the signal to noise ratio of 30∼40 is observed.