Nanocomposite thick films of CsPbI3: PVDF-HFP on plastics for direct conversion low-dose X-ray sensor

• Published in: Materials science in semiconductor processing Vol. 120; p. 105289
• Main Authors: Karthieka, R.R., Venkatasubbu, G. Devanand, Prakash, T.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.12.2020
• Subjects: Low-dose X-ray sensor; Nanocomposite thick films; PbI2 and CsPbI3 nano rods; Nanocomposite thick films; PbI2 and CsPbI3 nano rods; Low-dose X-ray sensor
• ISSN: 1369-8001; 1873-4081
• DOI: 10.1016/j.mssp.2020.105289

Nanocomposite thick films of PbI2: PVDF-HFP and CsPbI3: PVDF-HFP were coated on the top of interdigitated electrodes and studied for their low-dose X-ray sensing behaviour. The X-ray sensing measurement was performed for different exposure durations at room temperature up to 3.2 s using an intra-oral AC X-ray machine. The difference in the measured photocurrent under the illumination of pulsed X-ray was recorded using a Keithley 2450 source meter interfaced with dedicated computer. Prior to the sensing measurement, the pristine polycrystalline samples and thick films were studied for structural, microstructural and optical properties respectively, using a powder X-ray diffraction, scanning electron microscope, Raman and diffuse reflectance spectrophotometers. The observed results reveal that all samples are single phase without any other impurities in the form of a uniform thick dense film with crystallites in rod morphology (2 μm length and 200 nm diameter). An appreciable sensitivity of CsPbI3: PVDF-HFP thick film for a different dose durations as compared with PbI2: PVDF-HFP thick film explores the possibility of using it for low dose X-ray sensor development.