The progress of X-ray fluorescence computed tomography at SSRF

X-ray fluorescence computed tomography is a stimulated emission tomography that allows nondestructive reconstruction of elements distribution in the sample and has been applied in many fields. Since 2007 we have developed X-ray fluorescence tomography for microanalysis. In 2010, the system was estab...

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Bibliographic Details
Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 305; pp. 5 - 8
Main Authors Deng, Biao, Yang, Qun, Du, Guohao, Tong, Yajun, Xie, Honglan, Xiao, Tiqiao
Format Journal Article
LanguageEnglish
Published Elsevier B.V 15.06.2013
Subjects
Element imaging
Synchrotron radiation
X-ray fluorescence computed tomography
Element imaging
Synchrotron radiation
X-ray fluorescence computed tomography
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Summary:X-ray fluorescence computed tomography is a stimulated emission tomography that allows nondestructive reconstruction of elements distribution in the sample and has been applied in many fields. Since 2007 we have developed X-ray fluorescence tomography for microanalysis. In 2010, the system was established at the Shanghai Synchrotron Radiation Facility (SSRF) and preliminary experimental results were obtained at the X-ray imaging (BL13W1) and hard X-ray micro-focusing beamline (BL15U1). Recently, an ordered-subsets expectation maximization algorithm has been introduced to speed up the data acquisition process. We are now studying accelerating X-ray fluorescence computed tomography based fast scanning and the new algorithm.
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2013.04.045