On the pinched hysteresis behavior in a state-controlled resistor

• Published in: International journal of electronics and communications Vol. 74; pp. 171 - 175
• Main Authors: Elwakil, A.S., Maundy, B.J., Psychalinos, C.
• Format: Journal Article
• Language: English
• Published: Elsevier GmbH 01.04.2017
• ISSN: 1434-8411; 1618-0399
• DOI: 10.1016/j.aeue.2017.02.003

We show that the pinched hysteresis behavior observed in a voltage-controlled resistor with state-feedback self-control can be attributed to the current flowing in the parasitic capacitance holding the voltage across this resistor. A mathematical model describing this circuit structure is derived and validated numerically. To provide experimental evidence of this proposal, a circuit representing a voltage-controlled resistor is placed in parallel with a capacitor and then the current in this capacitor, which is proportional to the derivative of the applied voltage, is sensed, converted into a voltage and used to control the resistance value. This leads to the appearance of a pinched hysteresis loop as theoretically predicted. This work provides further insight into the origin of this behavior in fabricated solid-state devices that can be shown to follow the proposed circuit structure.