Use of active-edge silicon detectors as X-ray beam monitors

• Published in: Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 582; no. 1; pp. 178 - 181
• Main Authors: Kenney, C.J., Hasi, J., Parker, Sherwood, Thompson, A.C., Westbrook, E.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 11.11.2007
• Subjects: Active-edge X-ray detectors; Silicon radiation detectors; Synchrotron beam monitors; Synchrotron beam monitors; Silicon radiation detectors; 07.85.Qe; 85.30.−z; Active-edge X-ray detectors; 07.85.Fv
• ISSN: 0168-9002; 1872-9576
• DOI: 10.1016/j.nima.2007.08.102

Silicon detectors have been developed which are active to within several microns of the physical edge of the detector. These active-edge devices can be placed near an intense X-ray beam to accurately measure the X-ray beam properties. In addition, they can be fabricated in a variety of geometries that will be useful for monitoring the intensity, profile, and position of synchrotron X-ray beams. One shape is a detector with a through hole surrounded by four active elements. The hole allows the intense X-ray beam to go through the center while the four elements can detect any change in the position or dispersion of the beam. Another shape is a rectangular 5 mm long×0.5 mm wide device with a set of four elements that are 100 μm wide. These devices could be mounted on the upstream side of the jaws of an x– y collimating slit to measure the intensity profile of the beam that each jaw of the slit is stopping. Small detectors could also be mounted in a cylindrical beam stop to give on-line beam intensity measurements. A variety of different geometries were tested at beamline 10.3.1 of the Advanced Light Source using a 12.5 keV X-ray beam. They have wide dynamic range, excellent position sensitivity and low sensitivity to radiation damage.