Progress in the production of CsI and diamond thin film photocathodes

The comparison between the quantum efficiency of photocathodes coated with thin CsI films obtained by thermal evaporation and, for the first time, by Ar ion-beam sputtering is reported. The sensitivity of photocathodes has been found to be strongly dependent on the morphology and roughness of the ev...

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Published inNuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment Vol. 553; no. 1; pp. 157 - 164
Main Authors Nitti, M.A., Nappi, E., Valentini, A., Bénédic, F., Bruno, P., Cicala, G.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 11.11.2005
Subjects
Caesium iodide
Diamond
Ion-beam sputtering
Microwave plasma-assisted chemical vapour deposition
Photocathodes
RICH detectors
Thermal evaporation
85.60.Ha
RICH detectors
52.25.O
Diamond
81.15.Ef
81.15.Cd
81.15.Gh
Photocathodes
Thermal evaporation
29.40.Ka
Ion-beam sputtering
Microwave plasma-assisted chemical vapour deposition
81.05.Uw
81.15.–z
Caesium iodide
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Summary:The comparison between the quantum efficiency of photocathodes coated with thin CsI films obtained by thermal evaporation and, for the first time, by Ar ion-beam sputtering is reported. The sensitivity of photocathodes has been found to be strongly dependent on the morphology and roughness of the evaporated and sputtered CsI films. The effect of surface roughness on four different substrates has been investigated and is discussed. Preliminary measurement results on the photoemissivity of diamond films are also given.
ISSN:0168-9002
1872-9576
DOI:10.1016/j.nima.2005.08.084