Dislocation substructure evolution on Al creep under the action of the weak electric potential

The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation sub...

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Published inMaterials science & engineering. A, Structural materials : properties, microstructure and processing Vol. 527; no. 3; pp. 858 - 861
Main Authors Gromov, V.E., Ivanov, Yu.F., Stolboushkina, O.A., Konovalov, S.V.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 15.01.2010
Subjects
Aluminum
Dislocations
Electron microscopy
Fracture
Fracture
Electron microscopy
Aluminum
Dislocations
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Summary:The dislocation substructure evolution on Al creep under the action of the weak electric potential is established by methods of transmission diffraction electron microscopy. It is shown that change of the electrical potential of the Al sample surface is accompanied by the increase of dislocation substructure self-organization degree.
ISSN:0921-5093
1873-4936
DOI:10.1016/j.msea.2009.10.045