Imaging properties of a multi-reflection time-of-flight mass analyzer

• Published in: International journal of mass spectrometry Vol. 463; p. 116547
• Main Authors: Verenchikov, Anatoly N., Yavor, Mikhail I.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.05.2021
• Subjects: Flight time; Imaging mass spectrometry; Ion mirror; Mass analyzer; Mass resolving power; Imaging mass spectrometry; Mass resolving power; Mass analyzer; Ion mirror; Flight time
• ISSN: 1387-3806; 1873-2798
• DOI: 10.1016/j.ijms.2021.116547

Ion-optical and imaging properties are characterized for a multi-reflecting time-of-flight (MR-TOF) analyzer based on planar ion mirrors and lenses. Mass and spatial resolutions are numerically evaluated for a 1.3 m long MR-TOF analyzer with 10 m flight path. A spatial resolution of a few microns is predicted for smaller (1–4 mm2) fields of view. For larger (100 mm2) fields of view the spatial resolution degrades to sub-mm, which still may be used for the simultaneous mapping of array ion sources. The aberration limit of the mass resolving power remains above Rm = 300 000 within 100 mm2 field of view and within 3% energy spread. [Display omitted] •Ion-optical concept of an imaging multi-reflection mirror-type TOF mass analyzer presented.•Realistic mass resolving power of 50 000–100 000 at 300 000 aberration limit.•Spatial resolution of 5 μm at 1–4 mm2 field of view.•Mapping of 100 mm2 field of view with 100 sources for a parallel multi-source mass analysis.