Soft X-ray resonant magnetic scattering studies on Fe/CoO exchange bias system

We have used soft X-ray resonant magnetic scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we ha...

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Bibliographic Details
Published inJournal of magnetism and magnetic materials Vol. 300; no. 1; pp. 206 - 210
Main Authors Radu, Florin, Nefedov, Alexei, Grabis, Johannes, Nowak, Gregor, Bergmann, Andre, Zabel, Hartmut
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.05.2006
Subjects
Exchange bias
X-ray resonant magnetic scattering
61.10.Kwn
X-ray resonant magnetic scattering
75.60.Jk
75.25+z
75.70.Cn
Exchange bias
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Summary:We have used soft X-ray resonant magnetic scattering (XRMS) to search for the presence of an effective ferromagnetic moment belonging to the antiferromagnetic (AF) layer which is in close contact with a ferromagnetic (F) layer. Taking advantage of the element specificity of the XRMS technique, we have measured hysteresis loops of both Fe and CoO layers of a CoO(40 Å)/Fe (150 Å) exchange bias bilayer. From these measurements we have concluded that the proximity of the F layer induces a magnetic moment in the AF layer. The F moment of the AF layer has two components: one is frozen and does not follow the applied magnetic field and the other one follows in phase the ferromagnetic magnetization of the F layer. The temperature dependence of the F components belonging to the AF layer is shown and discussed.
ISSN:0304-8853
DOI:10.1016/j.jmmm.2005.10.064