Exposure of workers to extremely low frequency magnetic fields during the temperature-rise test of electrotechnical equipment

• Published in: Measurement : journal of the International Measurement Confederation Vol. 45; no. 8; pp. 1960 - 1965
• Main Authors: Halevidis, C.D., Koustellis, J.D., Polykrati, A.D., Bourkas, P.D.
• Format: Journal Article
• Language: English
• Published: Elsevier Ltd 01.10.2012
• Subjects: Electrotechnical apparatus; Extremely low frequency; Magnetic fields; Occupational exposure; Type and series testing; Electrotechnical apparatus; Magnetic fields; Occupational exposure; Extremely low frequency; Type and series testing
• ISSN: 0263-2241; 1873-412X
• DOI: 10.1016/j.measurement.2012.04.016

► ELF magnetic field exposure recorded during temperature-rise test. ► The exposure is significant as the test current are in the order of 100A. ► A rule of thumb regarding safety distances is proposed, so as to mitigate exposure. In this paper, extremely low frequency (ELF) magnetic fields (MFs) were measured during the temperature-rise test of various electrotechnical equipment. The number of workers subjected to magnetic fields from the temperature-rise test is small; however, the exposure can be significant as the testing currents can be in the order of hundreds amperes. The resultant magnetic field during testing can exceed the ICNIRP limits for occupational exposure. The magnetic field exposure was recorded and statistical measures were extracted for three electrotechnical apparatus. It was found that the Time-Weighted Average exposure per unit current can reach 0.0598μT/A. Additionally, in order to mitigate the exposure, a rule of thumb regarding safety distances has been proposed. It is shown that the use of this rule of thumb can reduce the magnetic field exposure.