A new technique for the deposition of standard solutions in total reflection X-ray fluorescence spectrometry (TXRF) using pico-droplets generated by inkjet printers and its applicability for aerosol analysis with SR-TXRF

• Published in: Spectrochimica acta. Part B: Atomic spectroscopy Vol. 61; no. 10; pp. 1098 - 1104
• Main Authors: Fittschen, U.E.A., Hauschild, S., Amberger, M.A., Lammel, G., Streli, C., Förster, S., Wobrauschek, P., Jokubonis, C., Pepponi, G., Falkenberg, G., Broekaert, J.A.C.
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.11.2006
• Subjects: Aerosol analysis; Calibration; Inkjet printer; Pico-droplet; SR-TXRF; Inkjet printer; SR-TXRF; Aerosol analysis; Calibration; Pico-droplet
• ISSN: 0584-8547; 1873-3565
• DOI: 10.1016/j.sab.2006.09.009

A new technique for the deposition of standard solutions on particulate aerosol samples using pico-droplets for elemental determinations with total reflection X-ray fluorescence spectrometry (TXRF) is described. It enables short analysis times without influencing the sample structure and avoids time consuming scanning of the sample with the exciting beam in SR-TXRF analysis. Droplets of picoliter volume (∼ 5–130 pL) were generated with commercially available and slightly modified inkjet printers operated with popular image processing software. The size of the dried droplets on surfaces of different polarity namely silicone coated and untreated quartz reflectors, was determined for five different printer types and ten different cartridge types. The results show that droplets generated by inkjet printers are between 50 and 200 μm in diameter (corresponding to volumes of 5 to 130 pL) depending on the cartridge type, which is smaller than the width of the synchrotron beam used in the experiments (< 1 mm at an energy of 17 keV at the beamline L at HASYLAB, Hamburg). The precision of the printing of a certain amount of a single element standard solution was found to be comparable to aliquoting with micropipettes in TXRF, where for 2.5 ng of cobalt relative standard deviations of 12% are found. However, it could be shown that the printing of simple patterns is possible, which is important when structured samples have to be analysed.