Enhanced poling and infiltration for highly efficient electro-optic polymer-based Mach-Zehnder modulators

An ultra-narrow 40-nm slotted waveguide is fabricated to enable highly efficient, electro-optic polymer modulators. Our measurement results indicate that V π L’s below ∼ 1.19 V.mm are possible for the balanced Mach-Zehnder modulators using this ultra-narrow slotted waveguide on a hybrid silicon-orga...

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Published inOptics express Vol. 30; no. 15; pp. 27841 - 27857
Main Authors Taghavi, Iman, Dehghannasiri, Razi, Fan, Tianren, Tofini, Alexander, Moradinejad, Hesam, Efterkhar, Ali. A., Shekhar, Sudip, Chrostowski, Lukas, Jaeger, Nicolas A. F., Adibi, Ali
Format Journal Article
LanguageEnglish
Published 18.07.2022
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Summary:An ultra-narrow 40-nm slotted waveguide is fabricated to enable highly efficient, electro-optic polymer modulators. Our measurement results indicate that V π L’s below ∼ 1.19 V.mm are possible for the balanced Mach-Zehnder modulators using this ultra-narrow slotted waveguide on a hybrid silicon-organic hybrid platform. Our simulations suggest that V π L’s can be further reduced to ∼ 0.35 V.mm if appropriate doping is utilized. In addition to adapting standard recipes, we developed two novel fabrication processes to achieve miniaturized devices with high modulation sensitivity. To boost compactness and decrease the overall footprint, we use a fabrication approach based on air bridge interconnects on thick, thermally-reflowed, MaN 2410 E-beam resist protected by an alumina layer. To overcome the challenges of high currents and imperfect infiltration of polymers into ultra-narrow slots, we use a carefully designed, atomically-thin layer of TiO 2 as a carrier barrier to enhance the efficiency of our electro-optic polymers. The anticipated increase in total capacitance due to the TiO 2 layer is negligible. Applying our TiO 2 surface treatment to the ultra-narrow slot allows us to obtain an improved index change efficiency (∂ n /∂ V ) of ∼ 22% for a 5 nm TiO 2 layer. Furthermore, compared to non-optimized cases, our peak measured current during poling is reduced by a factor of ∼ 3.
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ISSN:1094-4087
1094-4087
DOI:10.1364/OE.460830