A combined laser-induced breakdown and Raman spectroscopy Echelle system for elemental and molecular microanalysis

Raman and laser-induced breakdown spectroscopy is integrated into a single system for molecular and elemental microanalyses. Both analyses are performed on the same ~ 0.002 mm 2 sample spot allowing the assessment of sample heterogeneity on a micrometric scale through mapping and scanning. The core...

Full description

Saved in:
Bibliographic Details
Published inSpectrochimica acta. Part B: Atomic spectroscopy Vol. 64; no. 11; pp. 1219 - 1227
Main Authors Hoehse, Marek, Mory, David, Florek, Stefan, Weritz, Friederike, Gornushkin, Igor, Panne, Ulrich
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.11.2009
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Raman and laser-induced breakdown spectroscopy is integrated into a single system for molecular and elemental microanalyses. Both analyses are performed on the same ~ 0.002 mm 2 sample spot allowing the assessment of sample heterogeneity on a micrometric scale through mapping and scanning. The core of the spectrometer system is a novel high resolution dual arm Echelle spectrograph utilized for both techniques. In contrast to scanning Raman spectroscopy systems, the Echelle–Raman spectrograph provides a high resolution spectrum in a broad spectral range of 200–6000 cm − 1 without moving the dispersive element. The system displays comparable or better sensitivity and spectral resolution in comparison to a state-of-the-art scanning Raman microscope and allows short analysis times for both Raman and laser induced breakdown spectroscopy. The laser-induced breakdown spectroscopy performance of the system is characterized by ppm detection limits, high spectral resolving power (15,000), and broad spectral range (290–945 nm). The capability of the system is demonstrated with the mapping of heterogeneous mineral samples and layer by layer analysis of pigments revealing the advantages of combining the techniques in a single unified set-up.
ISSN:0584-8547
1873-3565
DOI:10.1016/j.sab.2009.09.004