Reliability of MOCVD grown AlGaAs/GaAs laser diodes at -20 C heatsink temperature

Wide-stripe 808-nm laser diodes operated at constant current and at a heatsink temperature of -20 C for over 10000 h are discussed. The MOCVD-grown double-heterostructure lasers were processed with 60- mu m-wide oxide stripes and 150- mu m-long high-reflectivity passivated cavities. Devices were mou...

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Published inIEEE photonics technology letters Vol. 2; no. 5; pp. 316 - 318
Main Authors Begley, D.L., Dreisewerd, D., Fritz, W., Schwedt, S., Elliott, G., Langill, T., Luft, J., Wudy, E.
Format Journal Article
LanguageEnglish
Published IEEE 01.05.1990
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Summary:Wide-stripe 808-nm laser diodes operated at constant current and at a heatsink temperature of -20 C for over 10000 h are discussed. The MOCVD-grown double-heterostructure lasers were processed with 60- mu m-wide oxide stripes and 150- mu m-long high-reflectivity passivated cavities. Devices were mounted p-side down on BeO heatsinks with indium solder. Based on gradual degradation of output power (approximately 8*10/sup -5/ mW per kilohour), a median lifetime of over 30 years is projected.< >
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1041-1135
1941-0174
DOI:10.1109/68.54691