Reliability of MOCVD grown AlGaAs/GaAs laser diodes at -20 C heatsink temperature
Wide-stripe 808-nm laser diodes operated at constant current and at a heatsink temperature of -20 C for over 10000 h are discussed. The MOCVD-grown double-heterostructure lasers were processed with 60- mu m-wide oxide stripes and 150- mu m-long high-reflectivity passivated cavities. Devices were mou...
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Published in | IEEE photonics technology letters Vol. 2; no. 5; pp. 316 - 318 |
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Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
IEEE
01.05.1990
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Subjects | |
Online Access | Get full text |
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Summary: | Wide-stripe 808-nm laser diodes operated at constant current and at a heatsink temperature of -20 C for over 10000 h are discussed. The MOCVD-grown double-heterostructure lasers were processed with 60- mu m-wide oxide stripes and 150- mu m-long high-reflectivity passivated cavities. Devices were mounted p-side down on BeO heatsinks with indium solder. Based on gradual degradation of output power (approximately 8*10/sup -5/ mW per kilohour), a median lifetime of over 30 years is projected.< > |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1041-1135 1941-0174 |
DOI: | 10.1109/68.54691 |