Crystallization and microstructure-dependent elastic moduli of ferroelectric P(VDF–TrFE) thin films

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Bibliographic Details
Published inSoft matter Vol. 6; no. 22; p. 5802
Main Authors Hahm, Si-Woo, Khang, Dahl-Young
Format Journal Article
LanguageEnglish
Published 01.01.2010
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ISSN:1744-683X
1744-6848
DOI:10.1039/c0sm00350f