Predicting visual fatigue in integrated circuit packaging plants

• Published in: Human factors and ergonomics in manufacturing & service industries Vol. 20; no. 5; pp. 461 - 469
• Main Authors: Lin, Jhih-Tsong, Liang, Guo-Feng, Hwang, Sheue-Ling, Wang, Eric Min-yang
• Format: Journal Article
• Language: English
• Published: Hoboken Wiley Subscription Services, Inc., A Wiley Company 01.09.2010; Wiley Subscription Services, Inc
• Subjects: Correlation analysis; Critical fusion frequency; Ergonomics; Group Method of Data Handling; Human error; Integrated circuit packaging plant; Integrated circuits; Visual fatigue; Visual task performance; Yield rate
• ISSN: 1090-8471; 1520-6564; 1520-6564
• DOI: 10.1002/hfm.20196

In the reworking department of integrated circuit (IC) production, both inspection and repair are visual tasks, and reworking operators frequently complain about eyestrain problems that lead to human error and a low yield rate. In this study, we evaluate the relationship between the operators' visual fatigue and actual defect data gathered from May to June 2008 and find a positive relationship between visual fatigue and the number of defects. To prevent eyestrain overload, we develop a visual fatigue prediction model using as significant predictors working time, rest time, number of inspections, number of repairs, and task difficulty. After the model was implemented in a real workplace, both visual comfort and yield rate improved. © 2010 Wiley Periodicals, Inc.