A study of the effect of power electronic system interaction with power system voltage stability

Summary Voltage stability has of recent been a subject of growing concern to power system utilities. In this paper, 2 techniques, one based on topological structure of power networks and the other on the conventional power flow solution, are proposed for voltage stability analysis. The network struc...

Full description

Saved in:
Bibliographic Details
Published inInternational transactions on electrical energy systems Vol. 28; no. 8; pp. e2574 - n/a
Main Authors Adebayo, Isaiah G., Jimoh, Adisa A., Yusuff, Adedayo A.
Format Journal Article
LanguageEnglish
Published Hoboken John Wiley & Sons, Inc 01.08.2018
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:Summary Voltage stability has of recent been a subject of growing concern to power system utilities. In this paper, 2 techniques, one based on topological structure of power networks and the other on the conventional power flow solution, are proposed for voltage stability analysis. The network structural characteristics theory participation factor proposed is formulated to identify the weak bus of the system. The voltage stability enhancement is achieved through the incorporation of power electronic–based thyristor‐controlled series compensator device. This is done by modifying the admittance matrix and network structural characteristics theory participation factor formulated to incorporate the effect of variable reactance of thyristor‐controlled series compensator device. The second suggested approach based on power flow is also investigated. The results of both techniques are compared with the conventional approaches. The results of simulations obtained show that voltage stability enhancement can significantly be achieved from the network structural point of view, as it saves time and reduces system computational burden.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:2050-7038
2050-7038
DOI:10.1002/etep.2574