Risk Assessment of Post-Fault Temporary Overvoltage Using Generalized Short-Circuit Ratio

• Published in: IEEE transactions on power systems Vol. 39; no. 1; pp. 1837 - 1849
• Main Authors: Xin, Huanhai, Liu, Xinyu, Zheng, Di, Chen, Dong, Zhou, Yuhan, Marshall, Benjamin
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.01.2024; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Circuit faults; Delays; Electric power systems; Electronic systems; Fault-ride-through; generalized short-circuit ratio; localization; multi-infeed power electronic system; Nodes; Overvoltage; Reactive power; Renewable energy sources; Risk assessment; Risk management; Short circuits; temporary overvoltage (TOV); Transient analysis; Voltage control
• ISSN: 0885-8950; 1558-0679
• DOI: 10.1109/TPWRS.2023.3241307

Temporary overvoltage (TOV) is becoming one challenge for the integration of significant power electronics resources into a power system. To assess the risk of TOV in a Multi-Infeed Power Electronic System (MIPES), a worst-case estimation approach is proposed to assess TOV risk. The paper starts with analyzing the mechanism of TOV, which reveals that TOV is dominated by excessive reactive power resulting from comprehensive control laggings. Then, the principle of approximating the TOV for a Voltage Source Converter (VSC) connecting to an infinite bus is introduced within the context of the RMS model. After that, a method based on the concept of generalized short-circuit ratio for overvoltage (gSCR-TOV) is introduced to quantify the risk of TOV in a multi-bus system. This concept intends to permit screening to identify those nodes at greatest need for further EMT assessment. To localize these nodes, a concept of weighted sensitivity matrix is further proposed to pinpoint the bus subject to highest TOV in a MIPES. Finally, case studies of EMT time-domain simulations are carried out and verifies the effectiveness of the proposed methods.