MuralDiff: Diffusion for Ancient Murals Restoration on Large-Scale Pre-Training
This paper focuses on the crack detection and digital restoration of ancient mural cultural heritage, proposing a comprehensive method that combines the Unet network structure and diffusion model. Firstly, the Unet network structure is used for efficient crack detection in murals by constructing an...
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Published in | IEEE transactions on emerging topics in computational intelligence Vol. 8; no. 3; pp. 2169 - 2181 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Piscataway
IEEE
01.06.2024
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | This paper focuses on the crack detection and digital restoration of ancient mural cultural heritage, proposing a comprehensive method that combines the Unet network structure and diffusion model. Firstly, the Unet network structure is used for efficient crack detection in murals by constructing an ancient mural image dataset for training and validation, achieving accurate identification of mural cracks. Next, an edge-guided optimized masking strategy is adopted for mural restoration, effectively preserving the information of the murals and reducing the damage to the original murals during the restoration process. Lastly, a diffusion model is employed for digital restoration of murals, improving the restoration performance by adjusting parameters to achieve natural repair of mural cracks. Experimental results show that comprehensive method based on the Unet network and diffusion model has significant advantages in the tasks of crack detection and digital restoration of murals, providing a novel and effective approach for the protection and restoration of ancient murals. In addition, this research has significant implications for the technological development in the field of mural restoration and cultural heritage preservation, contributing to the advancement and technological innovation in related fields. |
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ISSN: | 2471-285X 2471-285X |
DOI: | 10.1109/TETCI.2024.3359038 |