Transient positron annihilation spectroscopy under light irradiation at liquid nitrogen temperature: evaluation of defect states in single-crystal ZnO

Abstract A time-dependent measurement system has been developed for positron annihilation spectroscopy to study the effects of light irradiation at liquid nitrogen temperature. The system enables the measurement of positron annihilation lifetimes after pulse light irradiation, utilizing various time...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 63; no. 3; pp. 38005 - 38008
Main Authors Nakajima, Makoto, Kinomura, Atsushi, Xu, Qiu, Kuriyama, Kazuo
Format Journal Article
LanguageEnglish
Published Tokyo IOP Publishing 01.03.2024
Japanese Journal of Applied Physics
Subjects
Crystal defects
Light irradiation
Liquid nitrogen
liquid nitrongen temperature
Positron annihilation
positron annihilation spectroscopy
positron lifetime
Single crystals
Time dependence
Time measurement
transient change
Windows (intervals)
Zinc oxide
ZnO
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Summary:Abstract A time-dependent measurement system has been developed for positron annihilation spectroscopy to study the effects of light irradiation at liquid nitrogen temperature. The system enables the measurement of positron annihilation lifetimes after pulse light irradiation, utilizing various time windows to investigate the transient changes of photo-excited vacancy-type defects. Additionally, this system facilitates coincidence Doppler broadening measurements during light irradiation at liquid nitrogen temperature. The system was successfully employed to analyze changes in positron lifetime and positron annihilation sites in electron-irradiated single-crystalline ZnO under light irradiation.
Bibliography:JJAP-105743
ISSN:0021-4922
1347-4065
DOI:10.35848/1347-4065/ad3007