Mitigating set-stuck failure in 3D phase change memory: substituting square pulses with surge pulses

• Published in: Science China. Information sciences Vol. 67; no. 5; p. 152403
• Main Authors: Li, Ninghua, Cai, Wang, Xiang, Jun, Tong, Hao, Cheng, Weiming, Miao, Xiangshui
• Format: Journal Article
• Language: English
• Published: Beijing Science China Press 01.05.2024; Springer Nature B.V
• Subjects: Amplitudes; Computer Science; Devices; Electric fields; Information Systems and Communication Service; Ion migration; Pulse duration; Research Paper; Simulation; Temperature; Threshold voltage; SET-stuck failure (SSF); square pulse; phase change memory (PCM); integration; surge pulse

In the devices that integrate phase change memory (PCM) and ovonic threshold switching (OTS), the OTS threshold voltage often surpasses the RESET operation voltage of PCM. The conventional application of square pulses hinders the successful completion of the SET operation in these integrated devices...