Mitigating set-stuck failure in 3D phase change memory: substituting square pulses with surge pulses

• Published in: Science China. Information sciences Vol. 67; no. 5; p. 152403
• Main Authors: Li, Ninghua, Cai, Wang, Xiang, Jun, Tong, Hao, Cheng, Weiming, Miao, Xiangshui
• Format: Journal Article
• Language: English
• Published: Beijing Science China Press 01.05.2024; Springer Nature B.V
• Subjects: Amplitudes; Computer Science; Devices; Electric fields; Information Systems and Communication Service; Ion migration; Pulse duration; Research Paper; Simulation; Temperature; Threshold voltage; SET-stuck failure (SSF); square pulse; phase change memory (PCM); integration; surge pulse
• ISSN: 1674-733X; 1869-1919
• DOI: 10.1007/s11432-023-3902-6

In the devices that integrate phase change memory (PCM) and ovonic threshold switching (OTS), the OTS threshold voltage often surpasses the RESET operation voltage of PCM. The conventional application of square pulses hinders the successful completion of the SET operation in these integrated devices. To address this challenge, a novel pulse called the surge pulse is introduced, which comprises a high amplitude pulse for OTS activation and a low amplitude pulse for PCM operation. By employing COMSOL simulation, the operational effectiveness of both square pulses and surge pulses is validated. Test results reveal that using a square pulse to operate the integrated device accelerates the occurrence of SET-stuck failure (SSF). In contrast, the surge pulse enables the integrated device to operate for at least 1000 cycles while preserving the essential cyclic characteristics. Additionally, an investigation into the overshoot component of the surge pulse is conducted, revealing that an increase in overshoot amplitude and pulse width also accelerates the emergence of SSF. By applying the theory of ion migration induced by the electric field, the root cause of SSF in integrated devices is explained, and the accuracy of the theory is validated through the application of a reverse pulse. In summary, this study elucidates the rationality of replacing the square pulse with a surge pulse, presenting a superior approach for operating PCM and OTS integrated devices.