Unusual types of extended defects in synthetic high pressure–high temperature diamonds

New unusual types of extended defects resembling bunches of divergent dislocations are observed in high quality synthetic HPHT single crystal diamonds grown at the lowest possible PT-conditions. Thorough characterisation of the samples by X-ray topotomography, optical microscopy and vibrational spec...

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Bibliographic Details
Published inCrystEngComm Vol. 20; no. 47; pp. 7700 - 7705
Main Authors Shiryaev, Andrey A., Zolotov, Denis A., Suprun, Olena M., Ivakhnenko, Sergei A., Averin, Alexey A., Buzmakov, Alexey V., Lysakovskyi, Valentin V., Dyachkova, Irina G., Asadchikov, Victor E.
Format Journal Article
LanguageEnglish
Published Cambridge Royal Society of Chemistry 2018
Subjects
Crystal defects
Crystal growth
Defects
Diamonds
Dislocations
Grain boundaries
High temperature
Nonmetallic inclusions
Optical microscopy
Single crystals
X ray spectra
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Summary:New unusual types of extended defects resembling bunches of divergent dislocations are observed in high quality synthetic HPHT single crystal diamonds grown at the lowest possible PT-conditions. Thorough characterisation of the samples by X-ray topotomography, optical microscopy and vibrational spectroscopy allowed the conclusion that these defects are related to dislocations decorated by oxide inclusions. An unusual feature of the defects is their origin: small-angle grain boundaries formed during growth instabilities. Although similar defects were observed in some isostructural materials, their presence in diamonds was not reported earlier.
ISSN:1466-8033
1466-8033
DOI:10.1039/C8CE01499J