Precision Test Fixture for Measuring Equivalent Circuit Parameters of GHz Surface-Mounted Quarts Crystal Units
We developed a coaxial-type fixture for precisely measurement of the impedance characteristics of small surface-mounted quartz crystal units. This fixture is applicable to the one-port S-parameter reflection method proposed in IEC60444-5, and measures the frequency impedance characteristics of a dev...
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Published in | Japanese Journal of Applied Physics Vol. 51; no. 7; pp. 07GC09 - 07GC09-2 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
The Japan Society of Applied Physics
01.07.2012
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Online Access | Get full text |
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