Precision Test Fixture for Measuring Equivalent Circuit Parameters of GHz Surface-Mounted Quarts Crystal Units

We developed a coaxial-type fixture for precisely measurement of the impedance characteristics of small surface-mounted quartz crystal units. This fixture is applicable to the one-port S-parameter reflection method proposed in IEC60444-5, and measures the frequency impedance characteristics of a dev...

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Bibliographic Details
Published inJapanese Journal of Applied Physics Vol. 51; no. 7; pp. 07GC09 - 07GC09-2
Main Authors Watanabe, Yasuaki, Wada, Manabu, Sakuta, Yukinori, Hattori, Masashi, Takahashi, Osamu
Format Journal Article
LanguageEnglish
Published The Japan Society of Applied Physics 01.07.2012
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Summary:We developed a coaxial-type fixture for precisely measurement of the impedance characteristics of small surface-mounted quartz crystal units. This fixture is applicable to the one-port S-parameter reflection method proposed in IEC60444-5, and measures the frequency impedance characteristics of a device under test (DUT) from its reflection coefficients. This measurement fixture uses a 65 GHz coaxial connector and calibrators with a 1.85 mm inside diameter. Using a "zero-length" coaxial center pin method, this fixture can be applied to up to 2 GHz devices without the need for electrical length compensation.
Bibliography:3225-type quartz crystal unit ($3.2\times 2.5$ mm 2 ). One-port reflection method. Schematic of proposed test fixture. Experimental setup. Reflection characteristics of termination.
ISSN:0021-4922
1347-4065
DOI:10.1143/JJAP.51.07GC09