Comparative Study of Carrier Lifetime Dependence on Dopant Concentration in Silicon and Germanium
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| Published in | Journal of the Electrochemical Society Vol. 154; no. 3; p. H231 |
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| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
2007
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| Online Access | Get full text |
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| ISSN: | 0013-4651 |
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| DOI: | 10.1149/1.2429031 |