DAD-FF: Hardening Designs by Delay-Adjustable D-Flip-Flop for Soft-Error-Rate Reduction

• Published in: IEEE transactions on very large scale integration (VLSI) systems Vol. 28; no. 4; pp. 1030 - 1042
• Main Authors: Lin, Dave Y.-W., Wen, Charles H.-P.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.04.2020; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Automotive electronics; Characterization; Computer architecture; Delays; design flow; Error reduction; Flip-flops; heavy ion; Heavy ions; Ions; Libraries; Microprocessors; Radiation hardening; Robustness; Safety critical; semiconductor device modeling; singleevent transient (SET); soft error; Soft errors; technology computer-aided design (TCAD) simulation

For the safety-critical applications such as biomedical and automobile electronics, the system failure induced by soft errors becomes a major issue of reliability. However, most of the commercial cell libraries do not include radiation-hardened components to build a safety-critical design. Therefore...